Digital IC Tester Using AT89S52 Microcontroller (For 74TTL Series Digital ICs)

Overview

ABSTRACT

This digital Integrated Circuit tester (IC tester) is used to test Integrated Circuits (ICs). We can easily test any digital IC using this kind of an IC tester. For testing an IC, we need to use different hardware circuits for different ICs; like we need a particular kind of tester for testing a logic gate and another for testing flip flops or shift registers which involves more complication and time involved will also be more. So here’s an IC tester to overcome this problem. Unlike other IC testers, this is more reliable and easier since we don’t need to rig up different kind of circuits for different kind of ICs, each time we need to test them.

This IC tester is constructed using 89c55 microcontroller along with a keyboard and a display unit. It can test digital ICs having a maximum of 24 pins. Since it is programmable, any number of ICs can be tested within the constraint of the memory available. This is a project based on arm7 microcontroller, which test the 74xx series IC. The coding includes testing of 7400, 7402, 7404, 7408, 7432, 7486 IC. It can be extended further Based on the need.

CHAPTER ONE

1.1                                                        INTRODUCTION

The digital IC tester is implemented by using the 8051 (AT89S52) microcontroller. The processing of the inputs and outputs is done by the microcontroller. The display part on the microcontroller board is modelled using LCD. After the successful testing of the IC, the result is displayed on the LCD.

The basic function of the digital IC tester is to test a digital IC for correct logical functioning as described in the truth table and/or function table. It can test digital ICs having a maximum of 14 or 16 pins. Since it is programmable, any number of ICs can be tested within the constraint of the memory available. This model applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the outputs in the truth table. Any discrepancy in the functioning of the IC results in a fail indication, displays the faulty and good gates on the LCD. The testing procedure is accomplished with the help of keys present on the main board.

This is a project based on arm7 microcontroller, which test the 74xx series IC. The coding includes testing of 7400, 7402, 7404, 7408, 7432, 7486 IC. It can be extended further Based on the need.

This includes an extra board which have IC holder and which holds the IC’s which are to be tested. And this board also includes some push button which tells the system which IC is being tested. U just have to put in the ic and press the relative button to test the ic.

1.2                                             OBJECTIVE OF THE PROJECT

The objective of this work is to design a digital ic tester used in testing  digital IC’s, mainly belonging to the 74TTL series. FLIP-FLOP IC‟s (7400, 7402, 7404, 7408, 7432, 7474, 7486).

1.3                                         SIGNIFICANCE OF THE PROJECT

Unlike the IC testers available in the market today which are usually expensive, this IC tester is affordable and user-friendly. This IC tester is constructed using 8951 microcontroller along with a display unit. It can test digital ICs having a maximum of 24 pins. Since it is programmable, any number of ICs can be tested within the constraint of the memory available. This IC tester can be used to test a wide variety of ICs which includes simple logic gates and also sequential and combinational ICs like flip-flops, counters, shift registers etc. It is portable and easy to use.

1.4                                                 SCOPE OF THE PROJECT

An Integrated Circuit tester (IC tester) is used to test Integrated Circuits (ICs). We can easily test any digital IC using this kind of an IC tester. For testing an IC, we need to use different hardware circuits for different ICs; like we need a particular kind of tester for testing flip flops which involves more complication and time involved will also be more. So here’s an IC tester to overcome this problem. Unlike other IC testers, this is more reliable and easier since we don’t need to rig up different kind of circuits for different kind of ICs, each time we need to test them.

1.5                                           LIMITATION OF THE PROJECT

This is a project based on arm7 microcontroller, which is limited in testing the 74xx series IC such as 7400, 7402, 7404, 7408, 7432, 7486 IC. It can be extended further Based on the need.

1.6                                              PURPOSE OF THE PROJECT

This device is used testing of the IC, the result is displayed on the LCD. The basic function of the digital IC tester is to test a digital IC for correct logical. This device is used in testing  digital IC’s, mainly belonging to the 74TTL series. FLIP-FLOP IC‟s (7400, 7402, 7404, 7408, 7432, 7474, 7486).

1.7                                                PROBLEM OF THE WORK

  1. Circuiting on breadboard was not firm enough.
  2. With the help of internal clock, it was hard to synchronize the ICs which require clock so we created manual clock.

1.8                                   FUTURE EXTENSIONS OF THE PROJECT

The project can be extended as following:

1) It Can be extended for more than 16 pin ic’s by changing some hardware and coding.

2) It Can be extended to analog IC’s

1.9                                        PROJECT WORK ORGANIZATION

The various stages involved in the development of this project have been properly put into five chapters to enhance comprehensive and concise reading. In this project thesis, the project is organized sequentially as follows:

Chapter one of this work is on the introduction to a digital tester. In this chapter, the background, significance, objective limitation and problem of a digital tester were discussed.

Chapter two is on literature review of a digital tester. In this chapter, all the literature pertaining to this work was reviewed.

Chapter three is on design methodology. In this chapter all the method involved during the design and construction were discussed.

Chapter four is on testing analysis. All testing that result accurate functionality was analyzed.

Chapter five is on conclusion, recommendation and references.

Research Guidelines

The Title Page should be the first section of your project “Digital IC Tester Using AT89S52 Microcontroller (For 74TTL Series Digital ICs)”, providing essential details like the project title, your name, your supervisor’s name, the institution, and the submission date. After that, the Abstract offers a brief summary of your project, touching on its purpose, methods, results, and conclusions in 150-300 words. The Acknowledgments section is where you can thank those who supported your research, such as your supervisor, peers, or organizations that provided resources.

Next, the Table of Contents organizes the Digital IC Tester Using AT89S52 Microcontroller (For 74TTL Series Digital ICs) by listing its chapters and sections, along with page numbers for easy reference. The List of Figures and List of Tables help guide readers to specific visual elements like graphs, charts, or tables included in the document. There should also be an Abbreviations and Glossary section to explain any specialized terms or acronyms, making the content clearer to readers unfamiliar with the technical language.

The main body of the Digital IC Tester Using AT89S52 Microcontroller (For 74TTL Series Digital ICs) should start with the Introduction, which provides background information, outlines the research problem, states your objectives, and gives a brief overview of your research methods. Following that, the Literature Review offers an in-depth look at previous research relevant to your project, identifying gaps your study aims to address. The Methodology section then explains the research design, tools, and data collection methods you used to conduct the project and analyze the data.

In the Results and Discussion section, you present your findings and discuss them in relation to the Digital IC Tester Using AT89S52 Microcontroller (For 74TTL Series Digital ICs) research questions or objectives, often using tables or charts to help explain the data. The Conclusion summarizes the key results, discusses their implications, and suggests possible directions for future research. You may also include recommendations based on your findings, offering practical advice for improvements or applications. Finally, the Digital IC Tester Using AT89S52 Microcontroller (For 74TTL Series Digital ICs) project should include a References or Bibliography section to list all the sources you cited, as well as Appendices for any additional material. A Statement of Originality is often included to confirm the authenticity of your work